PVE300 Photovoltaic EQE (IPCE) and IQE solution

Options

All configurations and accessories are designed to adapt the PVE300 system to the testing requirements of all single and multi-junction PV devices, including:

  • Temperature-controlled vacuum mounts for substrate, superstrate or packaged devices
  • Programmable Single or multiple channel bias sources, including an AM1.5 matched bias source
  • Voltage biasing for the assessment of multiple junction cells and some thin film device
  • Integrating sphere-based determination of reflectance/transmittance to yield internal quantum efficiency (IQE, %)
  • Motorised x-y stage for device uniformity measurement
  • Characterisation of fluorescent materials with addition of second monochromator
  • Customised Electrical Probe
  • Temperature Sensor
  • Probe Beam Irradiance Control
  • High Output Monochromatic Light Source

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