PVE300 Photovoltaic EQE (IPCE) and IQE solution
Options
All configurations and accessories are designed to adapt the PVE300 system to the testing requirements of all single and multi-junction PV devices, including:
- Temperature-controlled vacuum mounts for substrate, superstrate or packaged devices
- Programmable Single or multiple channel bias sources, including an AM1.5 matched bias source
- Voltage biasing for the assessment of multiple junction cells and some thin film device
- Integrating sphere-based determination of reflectance/transmittance to yield internal quantum efficiency (IQE, %)
- Motorised x-y stage for device uniformity measurement
- Characterisation of fluorescent materials with addition of second monochromator
- Customised Electrical Probe
- Temperature Sensor
- Probe Beam Irradiance Control
- High Output Monochromatic Light Source