PVE300 Photovoltaic EQE (IPCE) and IQE solution

  • PVE300 Photovoltaic Testing Solution
  • PVE300 System Enclosure
  • PVE300 PV Efficiency Measurement
  • PVE300 System Components
  • PV Cell Under Test
  • Front Electrical Probe Superstate PV chuck
  • Front-Front Probe Superstate PV chuck
  • Front-Rear Probe Superstate PV chuck

The PVE300 features full compatibility with all types of photovoltaic devices, materials and architectures, including c:Si, mc:Si, a:Si, µ:Si, CdTe, CIGS, CIS, Ge, dye-sensitised, organic/polymer, tandem, multi-junction (2-, 3-, 4-junction and more), quantum well, quantum dots, chalcogenides and perovskites.

Core benefits

Features 

  • Optimised tuneable light source based on xenon-quartz tungsten halogen dual source and single monochromator
  • Wide range of operation (300-2500nm) beyond this, please enquire
  • Reflective optics beam delivery to sample plane
  • A range of sample mounts and detection electronics to suit all device types and architectures
  • Windows control software provides full automation via USB 2.0
  • Direct determination of device spectral response (SR, A W-1)
  • Direct determination of device external quantum efficiency (EQE/IPCE, %)
  • Direct determination of total reflectance, R and transmittance, T, to convert EQE to internal quantum efficiency (IQE, %)

Related Event

Applications 

  • IEC 60904-8:2014 - Photovoltaic devices - Part 8: Measurement of spectral responsivity of a photovoltaic (PV) device
  • IEC 60904-8-1:2017 - Photovoltaic devices - Part 8-1: Measurement of spectral responsivity of multi-junction photovoltaic (PV) devices

Reported Parameters

  • EQE/IPCE
  • IQE
  • Predicted Jsc
  • Reflectance
  • Transmittance

Recent Citations

Monochromatic Probe (TMc300)

Probe light source 75W Xenon and 100W Quartz halogen (QTH)
Monochromator configuration Triple grating, symmetric, single Czerny-Turner, 300mm focal length
Bandwidth Adjustable fixed slit, 1-10nm typical
Resolution 0.3nm (1200g/mm); 0.6nm (600g/mm)
Dispersion 2.7nm/mm (1200g/mm); 5.4nm/mm (600g/mm)
Wavelength range 300-1100nm (1200g/mm ); 1100-2500nm (600g/mm)
Wavelength accuracy ± 0.2nm (1200g/mm); ± 0.4nm (600g/mm)
Relay optic Mirror-based, 1.2x magnification
Probe size Up to 6x6mm

Temperature-Controlled Vacuum Mount

Temperature control 4x70W Peltier-based heat pump, water- cooled hot side
Temperature range 15-65°C
Temperature feedback Centrally-positioned sensor situated 3mm below sample plane
Temperature stability ± 1°C

Light Bias

Transport to sample Branched glass fibre bundle
Bias source irradiance 0-1.5 suns
Bias source uniformity ±1% over 1 cm2
Filter option Two 50mm square filter holders
Source options Quartz halogen/ Xenon/ Class B AM1.5

Automation

Software control Benwin+ Windows application
Interface USB

Reference Diodes

Diode & range Silicon 300-1100nm; Germanium 800-1800nm
Traceability PTB, Germany

Voltage Bias (optional)

Voltage range -20 to 20V
Current limit 1A

XY Stage (optional)

Travel in x 250mm
Travel in y 200mm
Positional Accuracy ±16µm
Bi-directional repeatability ±1µm
Resolution 0.5µm
Drive type Stepper motor
Speed 15mm/s

Integrating Sphere

Port size 15mm Ø (5 &10mm Ø port reducers supplied)
Coating Ba2SO4
Detector Silicon/ Germanium/ Silicon-InGaAs sandwich

Options

All configurations and accessories are designed to adapt the PVE300 system to the testing requirements of all single and multi-junction PV devices, including:

  • Temperature-controlled vacuum mounts for substrate, superstrate or packaged devices
  • Programmable Single or multiple channel bias sources, including an AM1.5 matched bias source
  • Voltage biasing for the assessment of multiple junction cells and some thin film device
  • Integrating sphere-based determination of reflectance/transmittance to yield internal quantum efficiency (IQE, %)
  • Motorised x-y stage for device uniformity measurement
  • Characterisation of fluorescent materials with addition of second monochromator
  • Customised Electrical Probe
  • Temperature Sensor
  • Probe Beam Irradiance Control
  • High Output Monochromatic Light Source

Responsivity Measurements

Example external quantum efficiency measurement
Responsivity of high efficiency solar cell materials
Responsivity of single junction solar cells
Responsivity measurement of tandem solar cells
Responsivity of tandem solar cells
Responsivity measurement of triple junction solar cells
Responsivity of triple junction cells
Responsivity of 4 Junction solar cell
Simultaneous multi-junction cell evaluation
Responsivity measurement of single junction solar cell
Example solar cell responsivity measurement

Internal Quantum Efficiency (IQE)

Solar cell internal quantum efficiency measurement
Example IQE measurement
Solar cell reflectance measurement
Example reflectance of solar cell

Ordering Information

PVE_300 PVE300 photovoltaic EQE (IPCE) and IQE solution

Background Information

Share this:

The Bentham Standard

We’re with you from the first call to the final result

Call us on +44 118 975 1355 or email us

You are currently offline. Some pages or content may fail to load.