Papers & Citations
AlGaN Ultraviolet Metal–Semiconductor–Metal Photodetectors with Reduced Graphene Oxide Contacts.
Pandit, B. and Cho, J., 2018. Applied Sciences, 8(11), p.2098.
Categories: Material & Chemical, Semiconductor & Process Monitoring
Optimization of Charge Carrier Extraction in Colloidal Quantum Dots Short‐Wave Infrared Photodiodes through Optical Engineering.
Georgitzikis, E., Malinowski, P.E., Maes, J., Hadipour, A., Hens, Z., Heremans, P. and Cheyns, D., 2018. Advanced Functional Materials, p.1804502.
Categories: Material & Chemical, Semiconductor & Process Monitoring
Metal–semiconductor–metal ultraviolet photodiodes based on reduced graphene oxide/GaN Schottky contacts.
Pandit, B. and Cho, J., 2018. Thin Solid Films.
Category: Semiconductor & Process Monitoring
Single-molecule photocurrent at a metal-molecule-semiconductor junction.
Vezzoli, A., Brooke, R.J., Higgins, S.J., Schwarzacher, W. and Nichols, R.J., 2017. Nano Letters.
Category: Semiconductor & Process Monitoring
An approach to discovering novel exciplex supramolecular complex based on carbazole-containing 1, 8-naphthalimide.
Bezuglyi, M., Ivaniuk, K., Volyniuk, D., Gražulevičius, J.V. and Bagdžiūnas, G., 2017. Dyes and Pigments.
Categories: Semiconductor & Process Monitoring, Material & Chemical
InSb quantum dots for the mid-infrared spectral range grown on GaAs substrates using metamorphic InAs buffer layers.
Lu, Q., Zhuang, Q., Marshall, A., Kesaria, M., Beanland, R. and Krier, A., 2014. Semiconductor Science and Technology, 29(7), p.075011.
Category: Semiconductor & Process Monitoring
Characterization of thick film poly (triarylamine) semiconductor diodes for direct x-ray detection.
Intaniwet, A., Mills, C.A., Shkunov, M., Thiem, H., Keddie, J.L. and Sellin, P.J., 2009. Journal of Applied Physics, 106(6), p.064513.
Category: Semiconductor & Process Monitoring
The experimental determination of the temperature dependence of the total emissivity of GaAs using a new temperature measurement technique.
Timans, P.J., 1992. Journal of applied physics, 72(2), pp.660-670.
Category: Semiconductor & Process Monitoring